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Archive for the ‘CHARACTERIZATION’ Category

The EKV MOSFET Model for Circuit Simulation

June 10, 2010 Leave a comment
  • the EKV MOSFET model structure
  • modelled effects and parameters
  • parameter extraction and results
  • model benchmarks and comparisons
  • outlook on future developments

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Categories: MOS DEVICE

MOSFET DC Models

June 10, 2010 Leave a comment

MOSFET Device models used by SPICE (Simulation Program for Integrated Circuit Engineering) simulators can be divided into three classes: First Generation Models (Level 1, Level 2, Level 3 Models), Second Generation Models (BISM, HSPICE Level 28, BSIM2) and Third Generation Models (BSIM3, etc.)…

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Categories: MOS DEVICE

MOS Device Characterization

June 10, 2010 Leave a comment

In this experiment, you will find the device parameters for an n-channel MOSFET. From the parameters, you will reproduce its I-V characteristics and compare them to SPICE. The characteristics will be compared to the SPICE level 1 model…

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Categories: MOS DEVICE
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